ALBATROS: adaptive line-based sampling trajectories for sequential measurements

dc.contributor.author	Van Steenkiste, Tom
dc.contributor.author	van der Herten, Joachim
dc.contributor.author	Deschrijver, Dirk
dc.contributor.author	Dhaene, Tom
dc.contributor.imecauthor	Van Steenkiste, Tom
dc.contributor.imecauthor	van der Herten, Joachim
dc.contributor.imecauthor	Deschrijver, Dirk
dc.contributor.imecauthor	Dhaene, Tom
dc.contributor.orcidimec	Deschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimec	Dhaene, Tom::0000-0003-2899-4636
dc.date.accessioned	2021-10-27T21:27:11Z
dc.date.available	2021-10-27T21:27:11Z
dc.date.embargo	9999-12-31
dc.date.issued	2019-04
dc.identifier.issn	0177-0667
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/34277
dc.identifier.url	https://doi.org/10.1007/s00366-018-0614-6
dc.source.beginpage	537
dc.source.endpage	550
dc.source.issue	2
dc.source.journal	Engineering with Computers
dc.source.volume	35
dc.title	ALBATROS: adaptive line-based sampling trajectories for sequential measurements
dc.type	Journal article
dspace.entity.type	Publication
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