Publication:
Characterization of intragrain defects in polycrystalline silicon layers obtained by aluminum-induced crystallization and epitaxy
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1916 since deposited on 2021-10-17
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Acq. date: 2026-07-16
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1916 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2026-07-16
Citations