Publication:

The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release

Date

2020
Proceedings Paper
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dc.contributor.authorGrasser, T.
dc.contributor.authorRzepa, G.
dc.contributor.authorStampfer, B.
dc.contributor.authorWaltl, M.
dc.contributor.authorKaczer, Ben
dc.contributor.authorO'Sullivan, Barry
dc.contributor.imecauthorKaczer, B.
dc.contributor.imecauthorO'Sullivan, B.
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.orcidextWaltl, M.::0000-0001-6042-759X
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.date.accessioned2021-11-22T08:56:04Z
dc.date.available2021-11-02T16:05:40Z
dc.date.available2021-11-22T08:56:04Z
dc.date.issued2020
dc.identifier.eisbn978-1-7281-3199-3
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38223
dc.publisherIEEE
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 28-MAY 30, 2020
dc.source.conferencelocationDallas, TX, USA
dc.source.journalna
dc.source.numberofpages6
dc.title

The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release

dc.typeProceedings paper
dspace.entity.typePublication
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