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Compressed sensing mm-wave SAR for non-destructive testing applications using side information
Publication:
Compressed sensing mm-wave SAR for non-destructive testing applications using side information
Date
2016
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Becquaert, Mathias
;
Cristofani, Edison
;
Pandey, Gokarna
;
Vandewal, Marijke
;
Stiens, Johan
;
Deligiannis, Nikos
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1916
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations
Metrics
Views
1916
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations