Publication:
A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs
Date
| dc.contributor.author | Watté, J. | |
| dc.contributor.author | Wuyts, Koen | |
| dc.contributor.author | Silverans, R. E. | |
| dc.contributor.author | Van Hove, Marleen | |
| dc.contributor.author | Van Rossum, Marc | |
| dc.date.accessioned | 2021-09-29T12:53:16Z | |
| dc.date.available | 2021-09-29T12:53:16Z | |
| dc.date.issued | 1994 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/458 | |
| dc.source.beginpage | 2055 | |
| dc.source.endpage | 2060 | |
| dc.source.journal | Journal of Applied Physics | |
| dc.source.volume | 75 | |
| dc.title | A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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