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Articles
Low temperature influence on the uniaxially strained FD SOI nMOSFETs behavior
Publication:
Low temperature influence on the uniaxially strained FD SOI nMOSFETs behavior
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Souza, M.
;
Pavanello, M.A.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Microelectronic Engineering
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1887
since deposited on 2021-10-16
Acq. date: 2025-12-10
Citations
Metrics
Views
1887
since deposited on 2021-10-16
Acq. date: 2025-12-10
Citations