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Articles
CD control using SiON BARL processing for sub-0.25μm lithography
Publication:
CD control using SiON BARL processing for sub-0.25μm lithography
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Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Fenghong
;
Op de Beeck, Maaike
;
Schaekers, Marc
;
Ronse, Kurt
;
Conley, W.
;
Gopalan, P.
;
Gangala, Hareen K
;
Dusa, M.
;
Bendik, Joe
Journal
Microelectronic Engineering
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2
since deposited on 2021-10-14
Acq. date: 2025-12-10
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2003
since deposited on 2021-10-14
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last month
1
last week
Acq. date: 2025-12-09
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Downloads
2
since deposited on 2021-10-14
Acq. date: 2025-12-10
Views
2003
since deposited on 2021-10-14
1
last month
1
last week
Acq. date: 2025-12-09
Citations