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Effects of heavy-ion strikes on fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques
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Effects of heavy-ion strikes on fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques
Date
2007
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Griffoni, A.
;
Gerardin, S.
;
Cester, A.
;
Paccagnella, A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
IEEE Trans. Nuclear Science
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1923
since deposited on 2021-10-16
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Acq. date: 2025-12-08
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Metrics
Views
1923
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-08
Citations