Publication:

Statistical characterization of current paths in narrow poly-si channels

Date

2011
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorDegraeve, Robin
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorSuhane, Amit
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorArreghini, Antonio
dc.contributor.authorTang, Baojun
dc.contributor.authorKaczer, Ben
dc.contributor.authorRoussel, Philippe
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-19T13:11:42Z
dc.date.available2021-10-19T13:11:42Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18820
dc.source.beginpage287
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate5/12/2011
dc.source.conferencelocationWashington, DC USA
dc.source.endpage290
dc.title

Statistical characterization of current paths in narrow poly-si channels

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
24021.pdf
Size:
609.86 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions