Publication:

Low-frequency noise assessment of CMOS transistros with a through-silicon via

Date

2011
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorSimoen, Eddy
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.date.accessioned2021-10-19T18:54:32Z
dc.date.available2021-10-19T18:54:32Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19791
dc.source.beginpage385
dc.source.conferenceULSI Process Integration 7
dc.source.conferencedate9/10/2011
dc.source.conferencelocationBoston, Ma USA
dc.source.endpage392
dc.title

Low-frequency noise assessment of CMOS transistros with a through-silicon via

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
23061.pdf
Size:
308.33 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions