RF and 1/F noise investigations on MESFETS and circuits transplanted by epitaxial lift off

dc.contributor.author	Morf, T.
dc.contributor.author	Brys, Catherine
dc.contributor.author	Van Daele, Peter
dc.contributor.author	Demeester, Piet
dc.contributor.author	Benedickter, H.
dc.contributor.author	Bächtold, W.
dc.contributor.imecauthor	Van Daele, Peter
dc.contributor.imecauthor	Demeester, Piet
dc.contributor.orcidimec	Van Daele, Peter::0000-0003-0557-7741
dc.date.accessioned	2021-09-29T15:13:44Z
dc.date.available	2021-09-29T15:13:44Z
dc.date.embargo	9999-12-31
dc.date.issued	1996
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1355
dc.source.beginpage	1489
dc.source.endpage	1494
dc.source.issue	9
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	43
dc.title	RF and 1/F noise investigations on MESFETS and circuits transplanted by epitaxial lift off
dc.type	Journal article
dspace.entity.type	Publication
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