Publication:

Explainable knowledge graph embeddings for industrial process monitoring & control

Date

2025
Journal article
https://doi.org/10.1016/j.inffus.2025.103242
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dc.contributor.authorWeyns, Michael
dc.contributor.authorBlyau, Thibault
dc.contributor.authorSteenwinckel, Bram
dc.contributor.authorDe Turck, Filip
dc.contributor.authorVan Hoecke, Sofie
dc.contributor.authorOngenae, Femke
dc.contributor.imecauthorWeyns, Michael
dc.contributor.imecauthorBlyau, Thibault
dc.contributor.imecauthorSteenwinckel, Bram
dc.contributor.imecauthorDe Turck, Filip
dc.contributor.imecauthorVan Hoecke, Sofie
dc.contributor.imecauthorOngenae, Femke
dc.contributor.orcidimecWeyns, Michael::0000-0002-6157-5997
dc.contributor.orcidimecBlyau, Thibault::0000-0002-8219-2987
dc.contributor.orcidimecSteenwinckel, Bram::0000-0002-3488-2334
dc.contributor.orcidimecDe Turck, Filip::0000-0003-4824-1199
dc.contributor.orcidimecVan Hoecke, Sofie::0000-0002-7865-6793
dc.contributor.orcidimecOngenae, Femke::0000-0003-2529-5477
dc.date.accessioned2025-07-08T04:49:18Z
dc.date.available2025-07-08T04:01:47Z
dc.date.available2025-07-08T04:49:18Z
dc.date.issued2025
dc.description.wosFundingTextPart of this research was supported through the Flemish Government (AI Research Program) . Part of this research was also supported through the CHAI project3 (HBC.2021.0671) , an imec.icon research project funded by imec and Agentschap Innoveren & Ondernemen (VLAIO) , with Allnex, Procter & Gamble, Dotdash, and IDLab as partners. The work of Michael Weyns and Thibault Blyau was supported by the Research Foundation-Flanders (FWO) , Belgium through their strategic basis research doctoral grants (1SD8821N and 1SH2C24N) .
dc.identifier.doi10.1016/j.inffus.2025.103242
dc.identifier.issn1566-2535
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45883
dc.publisherELSEVIER
dc.source.beginpage1
dc.source.endpage26
dc.source.journalINFORMATION FUSION
dc.source.numberofpages26
dc.source.volume123
dc.subject.keywordsONTOLOGY
dc.title

Explainable knowledge graph embeddings for industrial process monitoring & control

dc.typeJournal article
dspace.entity.typePublication
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