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Explainable knowledge graph embeddings for industrial process monitoring & control

 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-8219-2987
cris.virtual.orcid0000-0003-4824-1199
cris.virtual.orcid0000-0003-2529-5477
cris.virtual.orcid0000-0002-7865-6793
cris.virtual.orcid0000-0002-3488-2334
cris.virtual.orcid0000-0002-6157-5997
cris.virtualsource.departmentf3922a3d-8010-4e21-8d01-d5b72e17b3fb
cris.virtualsource.department505a9fa2-2261-4859-8c77-73c2ba21244c
cris.virtualsource.department9d6fa2a2-655c-4182-b90b-ee51beb7e92b
cris.virtualsource.department43fd6f27-126a-4a10-8c2e-2c15e86e4898
cris.virtualsource.department55d7029e-d5a6-44bc-9805-9fb86ae9ae2c
cris.virtualsource.department7761ec95-5106-420e-b10c-b5cc2185d312
cris.virtualsource.orcidf3922a3d-8010-4e21-8d01-d5b72e17b3fb
cris.virtualsource.orcid505a9fa2-2261-4859-8c77-73c2ba21244c
cris.virtualsource.orcid9d6fa2a2-655c-4182-b90b-ee51beb7e92b
cris.virtualsource.orcid43fd6f27-126a-4a10-8c2e-2c15e86e4898
cris.virtualsource.orcid55d7029e-d5a6-44bc-9805-9fb86ae9ae2c
cris.virtualsource.orcid7761ec95-5106-420e-b10c-b5cc2185d312
dc.contributor.authorWeyns, Michael
dc.contributor.authorBlyau, Thibault
dc.contributor.authorSteenwinckel, Bram
dc.contributor.authorDe Turck, Filip
dc.contributor.authorVan Hoecke, Sofie
dc.contributor.authorOngenae, Femke
dc.contributor.imecauthorWeyns, Michael
dc.contributor.imecauthorBlyau, Thibault
dc.contributor.imecauthorSteenwinckel, Bram
dc.contributor.imecauthorDe Turck, Filip
dc.contributor.imecauthorVan Hoecke, Sofie
dc.contributor.imecauthorOngenae, Femke
dc.contributor.orcidimecWeyns, Michael::0000-0002-6157-5997
dc.contributor.orcidimecBlyau, Thibault::0000-0002-8219-2987
dc.contributor.orcidimecSteenwinckel, Bram::0000-0002-3488-2334
dc.contributor.orcidimecDe Turck, Filip::0000-0003-4824-1199
dc.contributor.orcidimecVan Hoecke, Sofie::0000-0002-7865-6793
dc.contributor.orcidimecOngenae, Femke::0000-0003-2529-5477
dc.date.accessioned2025-07-08T04:49:18Z
dc.date.available2025-07-08T04:01:47Z
dc.date.available2025-07-08T04:49:18Z
dc.date.issued2025
dc.description.abstractAI-driven solutions are being employed in process monitoring and control to learn typical system behaviours under various conditions based on historical data. However, they are unable to take advantage of the rich, tacit domain expertise of experienced process engineers pertaining to these behaviours. Hybrid AI solutions are designed to fuse domain knowledge into machine learning models, but have so far been limited to specific industrial subdomains or applications and support only domain expertise in the form of equations. We propose an explainable hybrid AI methodology that can integrate any kind of tacit knowledge in an interpretable manner. First, we introduce a method to consolidate process data and domain-specific expertise in a generic fashion using Knowledge Graphs. Second, we propose a Knowledge Graph transformation technique to better capture the sequential aspects of a process and an accompanying white-box Knowledge Graph embedding technique that allows us to integrate domain knowledge directly into the feature space of a data-driven model. Third, we show how our methodology can be combined with explainability techniques, such as SHAP, to highlight directly in the graph which paths contributed most to the AI-driven decision. Our methodology has been evaluated on two real-world chemical engineering use cases. It outperforms data-driven baselines on all performance metrics, with average improvements of up to 8.57% and 10.21%.
dc.description.wosFundingTextPart of this research was supported through the Flemish Government (AI Research Program) . Part of this research was also supported through the CHAI project3 (HBC.2021.0671) , an imec.icon research project funded by imec and Agentschap Innoveren & Ondernemen (VLAIO) , with Allnex, Procter & Gamble, Dotdash, and IDLab as partners. The work of Michael Weyns and Thibault Blyau was supported by the Research Foundation-Flanders (FWO) , Belgium through their strategic basis research doctoral grants (1SD8821N and 1SH2C24N) .
dc.identifier.doi10.1016/j.inffus.2025.103242
dc.identifier.issn1566-2535
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45883
dc.publisherELSEVIER
dc.source.beginpage1
dc.source.endpage26
dc.source.journalINFORMATION FUSION
dc.source.numberofpages26
dc.source.volume123
dc.subject.keywordsONTOLOGY
dc.title

Explainable knowledge graph embeddings for industrial process monitoring & control

dc.typeJournal article
dspace.entity.typePublication
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