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Model for defect generation at the (100) Si/SiO2 interface during electron injection in MOS structures
Publication:
Model for defect generation at the (100) Si/SiO2 interface during electron injection in MOS structures
Date
2003
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Autran, J.L.
;
Heyns, Marc
;
Stesmans, Andre
Journal
Applied Surface Science
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1876
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1876
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations