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Model for defect generation at the (100) Si/SiO2 interface during electron injection in MOS structures
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1879 since deposited on 2021-10-15
3last month
Acq. date: 2026-01-06
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Metrics
Views
1879 since deposited on 2021-10-15
3last month
Acq. date: 2026-01-06
Citations