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Stress simulation of embedded Si1-yCy source/drain nMOSFETs
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Stress simulation of embedded Si1-yCy source/drain nMOSFETs
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Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Biswas, Abhijit
;
Bargallo Gonzalez, Mireia
;
De Keersgieter, An
;
Simoen, Eddy
;
Eneman, Geert
;
Verheyen, Peter
;
Claeys, Cor
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1821
since deposited on 2021-10-17
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Acq. date: 2026-01-07
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Metrics
Views
1821
since deposited on 2021-10-17
1
last month
Acq. date: 2026-01-07
Citations