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Correlation of fin shape fluctuations to FinFET electrical variability and noise margins of 6-T SRAM cells
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Correlation of fin shape fluctuations to FinFET electrical variability and noise margins of 6-T SRAM cells
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Date
2009
Proceedings Paper
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19753.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baravelli, Emanuele
;
De Marchi, L.
;
Jurczak, Gosia
;
Speciale, Nicolo
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Abstract
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1869
since deposited on 2021-10-17
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Acq. date: 2025-12-11
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Metrics
Views
1869
since deposited on 2021-10-17
2
last month
Acq. date: 2025-12-11
Citations