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Quantitative yield and reliability projection from antenna test results - A case study

Date

2000
Proceedings Paper
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dc.contributor.authorMason, P. W.
dc.contributor.authorCheung, K. P.
dc.contributor.authorHwang, D. K.
dc.contributor.authorCreusen, Martin
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-14T13:21:03Z
dc.date.available2021-10-14T13:21:03Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4569
dc.source.beginpage96
dc.source.conferenceSymposium on VLSI Technology. Digest of Technical Papers
dc.source.conferencedate13/06/2000
dc.source.conferencelocationHonolulu, HI USA
dc.source.endpage97
dc.title

Quantitative yield and reliability projection from antenna test results - A case study

dc.typeProceedings paper
dspace.entity.typePublication
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