Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
High resolution electrical characterization of laterally overgrown epitaxial InP
Publication:
High resolution electrical characterization of laterally overgrown epitaxial InP
Date
2003
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Anand, S.
;
Sun, Y.T.
;
Lourdudoss, S.
;
Xu, Mingwei
;
Vandervorst, Wilfried
Journal
Abstract
Description
Metrics
Views
1935
since deposited on 2021-10-15
407
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1935
since deposited on 2021-10-15
407
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations