Publication:
Soft gate oxide breakdown as a lifetime-limiting event in dynamic CMOS logic
Date
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-15T05:06:16Z | |
| dc.date.available | 2021-10-15T05:06:16Z | |
| dc.date.issued | 2003-12 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7716 | |
| dc.source.conference | Semiconductor Interface Specialists Conference | |
| dc.source.conferencedate | 4/12/2003 | |
| dc.source.conferencelocation | Washington, D.C. USA | |
| dc.title | Soft gate oxide breakdown as a lifetime-limiting event in dynamic CMOS logic | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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