Publication:

Electrical and thermal scaling trends for SOI FinFET ESD design

Date

2009
Proceedings Paper
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dc.contributor.authorThijs, Steven
dc.contributor.authorTremouilles, David
dc.contributor.authorGriffoni, Alessio
dc.contributor.authorRuss, Christian
dc.contributor.authorLinten, Dimitri
dc.contributor.authorScholz, Mirko
dc.contributor.authorCollaert, Nadine
dc.contributor.authorRooyackers, Rita
dc.contributor.authorDuvvury, Charvaka
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-18T03:35:48Z
dc.date.available2021-10-18T03:35:48Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16304
dc.source.beginpage2A.3
dc.source.conference31st Annual EOS/ESD Symposium
dc.source.conferencedate30/08/2009
dc.source.conferencelocationAnaheim, CA USA
dc.title

Electrical and thermal scaling trends for SOI FinFET ESD design

dc.typeProceedings paper
dspace.entity.typePublication
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