Publication:

Extended X-ray absorption fine structure investigation of Sn local environment in strained and relaxed epitaxial Ge1-xSnx films

Date

2015
Journal article
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dc.contributor.authorGencarelli, Federica
dc.contributor.authorGrandjean, Didier
dc.contributor.authorShimura, Yosuke
dc.contributor.authorVincent, Benjamin
dc.contributor.authorBanerjee, Dipanjan
dc.contributor.authorVantomme, Andre
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorLoo, Roger
dc.contributor.authorHeyns, Marc
dc.contributor.authorTemst, Kristiaan
dc.contributor.imecauthorVincent, Benjamin
dc.contributor.imecauthorVantomme, Andre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorTemst, Kristiaan
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-22T19:21:42Z
dc.date.available2021-10-22T19:21:42Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25301
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/117/9/10.1063/1.4913856
dc.source.beginpage95702
dc.source.issue9
dc.source.journalJournal of Applied Physics
dc.source.volume117
dc.title

Extended X-ray absorption fine structure investigation of Sn local environment in strained and relaxed epitaxial Ge1-xSnx films

dc.typeJournal article
dspace.entity.typePublication
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