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Electrical evaluation of the EPI/substrate interface quality after different in-situ and ex-situ low-temperature pre-epi cleaning methods
Publication:
Electrical evaluation of the EPI/substrate interface quality after different in-situ and ex-situ low-temperature pre-epi cleaning methods
Date
1999
Proceedings Paper
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3257.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Caymax, Matty
;
Decoutere, Stefaan
;
Röhr, Erika
;
Vandervorst, Wilfried
;
Heyns, Marc
;
Sprey, Hessel
;
Storm, Arjen
;
Maes, J.
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Abstract
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1907
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations
Metrics
Views
1907
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations