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Precise measurement of thin-film thickness in 3D-NAND device with CD-SEM
Publication:
Precise measurement of thin-film thickness in 3D-NAND device with CD-SEM
Date
2018
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ohashi, Takeyoshi
;
Yamaguchi, Atsuko
;
Hasumi, Kazuhisa
;
Ikota, Masami
;
Lorusso, Gian
;
Tan, Chi Lim
;
Van den Bosch, Geert
;
Furnemont, Arnaud
Journal
Journal of Micro/Nanolithography MEMS and MOEMS
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1935
since deposited on 2021-10-26
Acq. date: 2025-10-22
Citations
Metrics
Views
1935
since deposited on 2021-10-26
Acq. date: 2025-10-22
Citations