Publication:

Precise measurement of thin-film thickness in 3D-NAND device with CD-SEM

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1935 since deposited on 2021-10-26
Acq. date: 2025-10-22

Citations

Metrics

Views

1935 since deposited on 2021-10-26
Acq. date: 2025-10-22

Citations