Publication:
New insights into the relation between channel hot carrier degradation and oxide breakdown in short channel nMOSFETs
Date
| dc.contributor.author | Crupi, Felice | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | De Keersgieter, An | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.imecauthor | De Keersgieter, An | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
| dc.date.accessioned | 2021-10-15T04:13:54Z | |
| dc.date.available | 2021-10-15T04:13:54Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7367 | |
| dc.source.beginpage | 278 | |
| dc.source.endpage | 280 | |
| dc.source.issue | 4 | |
| dc.source.journal | IEEE Electron Device Letters | |
| dc.source.volume | 24 | |
| dc.title | New insights into the relation between channel hot carrier degradation and oxide breakdown in short channel nMOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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