Publication:
Probing 3D-semiconductors structures
Date
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-10-19T20:38:09Z | |
| dc.date.available | 2021-10-19T20:38:09Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2011 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20009 | |
| dc.source.beginpage | AS-TuA10 | |
| dc.source.conference | AVS 58th Annual International Symposium and Exhibition | |
| dc.source.conferencedate | 6/11/2011 | |
| dc.source.conferencelocation | Knoxville, TN USA | |
| dc.title | Probing 3D-semiconductors structures | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |