Publication:

On the characterization and separation of trapping and ferroelectric behavior in HfZrO FET

Date

2019
Journal article
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dc.contributor.authorAlam, Md Nur Kutubul
dc.contributor.authorKaczer, Ben
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorRzepa, Gerhard
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorHeyns, Marc
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorAlam, Md Nur Kutubul
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecVan Houdt, Jan::1234-1234-1234-1235
dc.date.accessioned2021-10-27T07:25:28Z
dc.date.available2021-10-27T07:25:28Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.issn2168-6734
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32418
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8667000
dc.source.beginpage855
dc.source.endpage862
dc.source.journalIEEE Journal of the Electron Devices Society
dc.source.volume7
dc.title

On the characterization and separation of trapping and ferroelectric behavior in HfZrO FET

dc.typeJournal article
dspace.entity.typePublication
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