Publication:

Via to line-end contact failures: the role of stochastics

Date

2025
Proceedings Paper
https://doi.org/10.1117/12.3050970
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Author(s)

Baskaran, Balakumar  
;
Cerbu, Dorin  
;
Beggiato, Matteo  
;
Blanco, Victor  
;
Lorusso, Gian  
;
De Simone, Danilo  
;
Adel, Michael E.
;
Mack, Chris A.

Journal

Proceedings of SPIE

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