Publication:
Root cause of charge loss in nitride-based localized trapping memory cell
Date
| dc.contributor.author | Furnemont, Arnaud | |
| dc.contributor.author | Rosmeulen, Maarten | |
| dc.contributor.author | van der Zanden, Koen | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.author | De Meyer, Kristin | |
| dc.contributor.author | Maes, Herman | |
| dc.contributor.imecauthor | Furnemont, Arnaud | |
| dc.contributor.imecauthor | Rosmeulen, Maarten | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.imecauthor | De Meyer, Kristin | |
| dc.contributor.orcidimec | Furnemont, Arnaud::0000-0002-6378-1030 | |
| dc.contributor.orcidimec | Rosmeulen, Maarten::0000-0002-3663-7439 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2021-10-16T16:12:32Z | |
| dc.date.available | 2021-10-16T16:12:32Z | |
| dc.date.issued | 2007 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12178 | |
| dc.source.beginpage | 1351 | |
| dc.source.endpage | 1359 | |
| dc.source.issue | 6 | |
| dc.source.journal | IEEE Trans. Electron Devices | |
| dc.source.volume | 54 | |
| dc.title | Root cause of charge loss in nitride-based localized trapping memory cell | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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