Publication:

Electromigration failure mechanisms for different flip chip configurations

Date

2011

Proceedings Paper

Simple item page Full metadata Statistics

Author(s)

;

;

Winters, Christophe

;

Cherman, Vladimir

;

;

Vandevelde, Bart

;

Dosseul, Franck

Statistics

1925 since deposited on 2021-10-19

Acq. date: 2026-02-24