Publication:
A unified approach for hot-carrier degradation of DC current gain and 1/f noise of bipolar transistors
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1956 since deposited on 2021-09-30
5last month
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Acq. date: 2026-10-13
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Statistics
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1956 since deposited on 2021-09-30
5last month
1last week
Acq. date: 2026-10-13
Citations