Publication:
A unified approach for hot-carrier degradation of DC current gain and 1/f noise of bipolar transistors
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1954 since deposited on 2021-09-30
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Acq. date: 2026-10-03
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Statistics
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1954 since deposited on 2021-09-30
3last month
3last week
Acq. date: 2026-10-03
Citations