Publication:
A unified approach for hot-carrier degradation of DC current gain and 1/f noise of bipolar transistors
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1950 since deposited on 2021-09-30
2last month
Acq. date: 2025-12-15
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Metrics
Views
1950 since deposited on 2021-09-30
2last month
Acq. date: 2025-12-15
Citations