Publication:
Impact of high-temperature electron irradiation on the electrical parameters of n-type CZ silicon
Date
| dc.contributor.author | Neimash, V. | |
| dc.contributor.author | Kraitshinskii, A. | |
| dc.contributor.author | Kras'ko, N. | |
| dc.contributor.author | Tischenko, V. | |
| dc.contributor.author | Voitovych, V. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T22:31:16Z | |
| dc.date.available | 2021-10-14T22:31:16Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6639 | |
| dc.source.beginpage | 336 | |
| dc.source.conference | High Purity Silicon VII | |
| dc.source.conferencedate | 20/10/2002 | |
| dc.source.conferencelocation | Salt Lake City, UT USA | |
| dc.source.endpage | 346 | |
| dc.title | Impact of high-temperature electron irradiation on the electrical parameters of n-type CZ silicon | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |