Comparison of two setups for contactless power measurements for side-channel analysis

dc.contributor.author	Beckers, Arthur
dc.contributor.author	Gierlichs, Benedikt
dc.contributor.author	Balasch, Joseph
dc.contributor.author	Verbauwhede, Ingrid
dc.date.accessioned	2021-10-25T16:41:36Z
dc.date.available	2021-10-25T16:41:36Z
dc.date.issued	2018
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/30224
dc.identifier.url	https://ieeexplore.ieee.org/document/8393879
dc.source.beginpage	739
dc.source.conference	IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibil
dc.source.conferencedate	14/05/2018
dc.source.conferencelocation	Singapore Singapore
dc.source.endpage	744
dc.title	Comparison of two setups for contactless power measurements for side-channel analysis
dc.type	Proceedings paper
dspace.entity.type	Publication
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