Publication:

In-situ recovery of the base current of SiGe NPN HBTs at high gamma dose levels

Date

2007
Proceedings Paper
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dc.contributor.authorPut, Sofie
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVan Huylenbroeck, Stefaan
dc.contributor.authorClaeys, Cor
dc.contributor.authorVan Uffelen, M.
dc.contributor.authorLeroux, P.
dc.contributor.authorBerghmans, F.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVan Huylenbroeck, Stefaan
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecVan Huylenbroeck, Stefaan::0000-0001-9978-3575
dc.date.accessioned2021-10-16T18:50:19Z
dc.date.available2021-10-16T18:50:19Z
dc.date.embargo9999-12-31
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12743
dc.source.beginpage452
dc.source.conferenceWorkshop on Semiconductor Advances for Future Electronics and Sensors - SAFE
dc.source.conferencedate29/11/2007
dc.source.conferencelocationVeldhoven the Netherlands
dc.source.endpage456
dc.title

In-situ recovery of the base current of SiGe NPN HBTs at high gamma dose levels

dc.typeProceedings paper
dspace.entity.typePublication
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