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Toward understanding the wide distribution of time scales in negative bias temperature instability

Date

2007
Proceedings Paper
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dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.contributor.authorFernandez, Raul
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-16T17:00:59Z
dc.date.available2021-10-16T17:00:59Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12377
dc.source.beginpage265
dc.source.conferenceSilicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9
dc.source.conferencedate6/05/2007
dc.source.conferencelocationChicago, IL USA
dc.source.endpage282
dc.title

Toward understanding the wide distribution of time scales in negative bias temperature instability

dc.typeProceedings paper
dspace.entity.typePublication
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