Publication:

Reliability challenges related to TSV integration and 3D stacking

Date

2016

Journal article

Simple item page Full metadata Statistics

Files

31750.pdf 1.83 MB

Author(s)

;

De Messemaeker, Joke

;

;

;

Varela Pedreira, Olalla

;

Cherman, Vladimir

;

Stucchi, Michele

;

De Wolf, Ingrid

;

Journal

IEEE Design & Test

Metrics

1956 since deposited on 2021-10-23

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Acq. date: 2026-01-10