Publication:

Reliability challenges related to TSV integration and 3D stacking

Date

2016

Journal article

Simple item page Full metadata Statistics

Files

31750.pdf 1.83 MB

Author(s)

;

De Messemaeker, Joke

;

;

;

Varela Pedreira, Olalla

;

Cherman, Vladimir

;

Stucchi, Michele

;

De Wolf, Ingrid

;

Journal

IEEE Design & Test

Statistics

1971 since deposited on 2021-10-23

6last month

1last week

Acq. date: 2026-08-04