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Minimizing the Size of Force-Controlled Point-Contacts on Silicon for Carrier Profiling

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dc.contributor.authorSnauwaerts, Jan
dc.contributor.authorBlanc, N.
dc.contributor.authorDe Wolf, Peter
dc.contributor.authorHellemans, L.
dc.date.accessioned2021-09-29T13:17:07Z
dc.date.available2021-09-29T13:17:07Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/893
dc.source.conference8th International Conference on Scanning Tunneling Microscopy / Spectroscopy and Related Techniques; 1995;
dc.source.conferencelocation
dc.title

Minimizing the Size of Force-Controlled Point-Contacts on Silicon for Carrier Profiling

dc.typeOral presentation
dspace.entity.typePublication
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