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Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs
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Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ayala, N.
;
Martin-Martinez, J.
;
Rodriguez, R.
;
Gonzalez, M.B.
;
Nafria, M.
;
Aymerich, X.
;
Simoen, Eddy
Journal
Microelectronics Reliability
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1874
since deposited on 2021-10-20
Acq. date: 2025-12-09
Citations
Metrics
Views
1874
since deposited on 2021-10-20
Acq. date: 2025-12-09
Citations