Transmission line characterization on silicon considering arbitrary distribution of the series and shunt pad parasitics

dc.contributor.author	Torres-Torres, Reydezel
dc.contributor.author	Venegas, Rafael
dc.contributor.author	Decoutere, Stefaan
dc.contributor.imecauthor	Decoutere, Stefaan
dc.contributor.orcidimec	Decoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned	2021-10-18T22:28:05Z
dc.date.available	2021-10-18T22:28:05Z
dc.date.issued	2010
dc.identifier.issn	0038-1101
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/18102
dc.identifier.url	www.elsevier.com/locate/sse
dc.source.beginpage	235
dc.source.endpage	242
dc.source.issue	3
dc.source.journal	Solid-State Electronics
dc.source.volume	54
dc.title	Transmission line characterization on silicon considering arbitrary distribution of the series and shunt pad parasitics
dc.type	Journal article
dspace.entity.type	Publication
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