Publication:
Characterization of a point-contact on silicon using force microscopy-supported resistance measurements
Date
| dc.contributor.author | De Wolf, Peter | |
| dc.contributor.author | Snauwaerts, Jan | |
| dc.contributor.author | Clarysse, Trudo | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.author | Hellemans, L. | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-09-29T13:05:17Z | |
| dc.date.available | 2021-09-29T13:05:17Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/602 | |
| dc.source.beginpage | 1530 | |
| dc.source.endpage | 2 | |
| dc.source.issue | 12 | |
| dc.source.journal | Appl. Phys. Lett. | |
| dc.source.volume | 66 | |
| dc.title | Characterization of a point-contact on silicon using force microscopy-supported resistance measurements | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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