Publication:

Impact of donor concentration, electric field, and temperature effects on the leakage current in germanium p+/n junctions

Date

2008
Journal article
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dc.contributor.authorEneman, Geert
dc.contributor.authorWiot, Maxime
dc.contributor.authorBrugere, Antoine
dc.contributor.authorSicart i Casain, Oriol
dc.contributor.authorSonde, Sushant
dc.contributor.authorBrunco, David
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorSatta, Alessandra
dc.contributor.authorHellings, Geert
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorClaeys, Cor
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-17T07:00:27Z
dc.date.available2021-10-17T07:00:27Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13694
dc.source.beginpage2287
dc.source.endpage2296
dc.source.issue9
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume55
dc.title

Impact of donor concentration, electric field, and temperature effects on the leakage current in germanium p+/n junctions

dc.typeJournal article
dspace.entity.typePublication
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