New challenges associated with hard X-ray photoelectron spectroscopy (report on the 2023 ASTM E42-ASSD AVS workshop)

dc.contributor.author	Herrera-Gomez, Alberto
dc.contributor.author	Cant, David J. H.
dc.contributor.author	Conard, Thierry
dc.contributor.author	Renault, Olivier
dc.contributor.author	Linford, Matthew R.
dc.contributor.author	Pinder, Joshua W.
dc.contributor.author	Fenton, Jeff
dc.contributor.author	Baer, Donald R.
dc.contributor.imecauthor	Conard, Thierry
dc.contributor.orcidimec	Conard, Thierry::0000-0002-4298-5851
dc.date.accessioned	2024-10-09T08:49:55Z
dc.date.available	2024-07-06T17:44:24Z
dc.date.available	2024-10-09T08:49:55Z
dc.date.issued	2024
dc.description.wosFundingText	One of the authors (AHG) acknowledges the suport from Conahcyt-Mexico (Fronteras 58518).
dc.identifier.doi	10.1002/sia.7340
dc.identifier.issn	0142-2421
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/44130
dc.publisher	WILEY
dc.source.beginpage	730
dc.source.endpage	736
dc.source.issue	10
dc.source.journal	SURFACE AND INTERFACE ANALYSIS
dc.source.numberofpages	7
dc.source.volume	56
dc.subject.keywords	ANGLE-RESOLVED XPS
dc.subject.keywords	ELECTRON
dc.subject.keywords	CALIBRATION
dc.subject.keywords	SCATTERING
dc.subject.keywords	AES
dc.title	New challenges associated with hard X-ray photoelectron spectroscopy (report on the 2023 ASTM E42-ASSD AVS workshop)
dc.type	Journal article
dspace.entity.type	Publication
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