Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
The use of in situ electrochemical measurements to predict corrosion issues during barrier CMP of 30 nm structures
Publication:
The use of in situ electrochemical measurements to predict corrosion issues during barrier CMP of 30 nm structures
Copy permalink
Date
2011-08
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Teugels, Lieve
;
Heylen, Nancy
;
Leunissen, Peter
Journal
Abstract
Description
Metrics
Views
1784
since deposited on 2021-10-19
Acq. date: 2025-12-15
Citations
Metrics
Views
1784
since deposited on 2021-10-19
Acq. date: 2025-12-15
Citations