Publication:
DESTIN: A new approach to interconnect reliability testing
Date
| dc.contributor.author | Witvrouw, Ann | |
| dc.contributor.author | Beyer, Gerald | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.author | Tielemans, Luc | |
| dc.contributor.imecauthor | Beyer, Gerald | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.date.accessioned | 2021-10-01T09:48:08Z | |
| dc.date.available | 2021-10-01T09:48:08Z | |
| dc.date.issued | 1998 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3155 | |
| dc.source.beginpage | 343 | |
| dc.source.endpage | 347 | |
| dc.source.journal | Semiconductor Fabtech | |
| dc.source.volume | 7 | |
| dc.title | DESTIN: A new approach to interconnect reliability testing | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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