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Thermal, structural and electrical study of the effect of annealing on the passivation by amorphous silicon of n-type crystalline (100) silicon surfaces

Date

2014
Proceedings Paper
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dc.contributor.authorMeddeb, Hosny
dc.contributor.authorBearda, Twan
dc.contributor.authorAbdelwahab, Ibrahim
dc.contributor.authorFerro, Valentina
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorAbdulraheem, Yaser
dc.contributor.authorEzzaouia, Hatem
dc.contributor.authorGordon, Ivan
dc.contributor.authorSzlufcik, Jozef
dc.contributor.authorPoortmans, Jef
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorGordon, Ivan
dc.contributor.imecauthorSzlufcik, Jozef
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-22T03:39:54Z
dc.date.available2021-10-22T03:39:54Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24231
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S1876610214012892
dc.source.beginpage818
dc.source.conferenceProceedings of the 4th International Conference on Crystalline Silicon Photovoltaics - SiliconPV
dc.source.conferencedate25/03/2014
dc.source.conferencelocations' Hertogenbosch The Netherlands
dc.source.endpage826
dc.title

Thermal, structural and electrical study of the effect of annealing on the passivation by amorphous silicon of n-type crystalline (100) silicon surfaces

dc.typeProceedings paper
dspace.entity.typePublication
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