Publication:
Parasitic subthreshold drain current and low frequency noise in GaN/AlGaN metal-oxide-semiconductor high-electron-mobility field-effect-transistors
| dc.contributor.author | Takakura, Kenichiro | |
| dc.contributor.author | Putcha, Vamsi | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Alian, AliReza | |
| dc.contributor.author | Peralagu, Uthayasankaran | |
| dc.contributor.author | Waldron, Niamh | |
| dc.contributor.author | Parvais, Bertrand | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.imecauthor | Takakura, K. | |
| dc.contributor.imecauthor | Putcha, V | |
| dc.contributor.imecauthor | Simoen, E. | |
| dc.contributor.imecauthor | Alian, A. R. | |
| dc.contributor.imecauthor | Peralagu, U. | |
| dc.contributor.imecauthor | Waldron, N. | |
| dc.contributor.imecauthor | Parvais, B. | |
| dc.contributor.imecauthor | Collaert, N. | |
| dc.contributor.imecauthor | Takakura, Kenichiro | |
| dc.contributor.imecauthor | Putcha, Vamsi | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.imecauthor | Alian, AliReza | |
| dc.contributor.imecauthor | Peralagu, Uthayasankaran | |
| dc.contributor.imecauthor | Waldron, Niamh | |
| dc.contributor.imecauthor | Parvais, Bertrand | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.orcidimec | Simoen, E.::0000-0002-5218-4046 | |
| dc.contributor.orcidimec | Parvais, B.::0000-0003-0769-7069 | |
| dc.contributor.orcidimec | Putcha, Vamsi::0000-0003-1907-5486 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.contributor.orcidimec | Peralagu, Uthayasankaran::0000-0001-9166-4408 | |
| dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.date.accessioned | 2022-01-20T09:28:48Z | |
| dc.date.available | 2021-11-02T16:07:27Z | |
| dc.date.available | 2022-01-20T09:28:48Z | |
| dc.date.issued | 2020 | |
| dc.identifier.doi | 10.1088/1361-6641/abce8c | |
| dc.identifier.issn | 0268-1242 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38376 | |
| dc.publisher | IOP PUBLISHING LTD | |
| dc.source.issue | 2 | |
| dc.source.journal | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | |
| dc.source.numberofpages | 4 | |
| dc.source.volume | 36 | |
| dc.title | Parasitic subthreshold drain current and low frequency noise in GaN/AlGaN metal-oxide-semiconductor high-electron-mobility field-effect-transistors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |