Publication:
Impact of different level copper interconnection on hot carrier lifetime of 0.18μm CMOS process
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Acq. date: 2025-12-15
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Acq. date: 2025-12-15
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2 since deposited on 2021-10-15
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1874 since deposited on 2021-10-15
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Acq. date: 2025-12-15
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