Publication:

Device-to-Materials Pathway for Electron Traps Detection in Amorphous GeSe-Based Selectors

 
dc.contributor.authorSlassi, Amine
dc.contributor.authorMedondjio, Linda-Sheila
dc.contributor.authorPadovani, Andrea
dc.contributor.authorTavanti, Francesco
dc.contributor.authorHe, Xu
dc.contributor.authorClima, Sergiu
dc.contributor.authorGarbin, Daniele
dc.contributor.authorKaczer, Ben
dc.contributor.authorLarcher, Luca
dc.contributor.authorOrdejon, Pablo
dc.contributor.authorCalzolari, Arrigo
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2023-07-20T13:11:49Z
dc.date.available2023-03-12T03:38:33Z
dc.date.available2023-07-20T13:11:49Z
dc.date.embargo2023-04-30
dc.date.issued2023
dc.description.wosFundingTextA.S. and L.-S.M. contributed equally to this work. This work was supported in part by EC through H2020-NMBP-TO-IND project GA no. 814487 (INTERSECT) and H2020- NMBP-TO-IND-2018-2020 project GA no. 953167 (OpenModel). ICN2 was supported by the CERCA Program of Generalitat de Catalunya, and by grant PGC2018- 096955-B-C43 funded by Spain's MCIN/AEI/10.13039/501100011033 and by ERDF "A way of making Europe". L.-S.M. received funding from the European Union's Horizon 2020 research and innovation programme under the Marie Sklodowska-Curie Grant Agreement No. 754558 (PREBIST - COFUND). L.-S.M.'s work has been performed in the context of the Physics Ph.D. program of the Universitat Autonoma de Barcelona. Computer resources were provided in part by the TACC supercomputing center (TX, USA) through QUANTRANS project, and by the Spanish Red Nacional de Supercomputacion through Grant Nos. FI-2020-2-0037, FI-2020-3-0034, FI-2021-1-0016, FI-2021-2-0017, FI-2021-3-0031, FI-2022-1-0035, and FI-2022-2-0042 at MareNostrum 4, BSC-CNS.
dc.identifier.doi10.1002/aelm.202201224
dc.identifier.issn2199-160X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41275
dc.publisherWILEY
dc.source.beginpageArt. 2201224
dc.source.endpagena
dc.source.issue4
dc.source.journalADVANCED ELECTRONIC MATERIALS
dc.source.numberofpages12
dc.source.volume9
dc.subject.keywordsSPECTRA
dc.subject.keywordsGLASSES
dc.subject.keywordsORDER
dc.subject.keywordsFILMS
dc.title

Device-to-Materials Pathway for Electron Traps Detection in Amorphous GeSe-Based Selectors

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
Adv Elect Materials - 2023 - Slassi - Device‐to‐Materials Pathway for Electron Traps Detection in Amorphous GeSe‐Based.pdf
Size:
2.06 MB
Format:
Adobe Portable Document Format
Description:
Published version
Publication available in collections: