Publication:
Reliability challenges in integrated high voltage devices
Date
| dc.contributor.author | Moens, Peter | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Moens, Peter | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.date.accessioned | 2021-10-16T03:29:06Z | |
| dc.date.available | 2021-10-16T03:29:06Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10896 | |
| dc.source.conference | International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | 17/04/2005 | |
| dc.source.conferencelocation | San Jose, CA USA | |
| dc.title | Reliability challenges in integrated high voltage devices | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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