Publication:

BTI reliability of advanced gate stacks for beyond silicon devices: challenges and opportunities

Date

2014-12
Proceedings Paper
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dc.contributor.authorGroeseneken, Guido
dc.contributor.authorFranco, Jacopo
dc.contributor.authorCho, Moon Ju
dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorRoussel, Philippe
dc.contributor.authorKauerauf, Thomas
dc.contributor.authorAlian, AliReza
dc.contributor.authorMitard, Jerome
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorLin, Dennis
dc.contributor.authorWaldron, Niamh
dc.contributor.authorSioncke, Sonja
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorMertens, Hans
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorHeyns, Marc
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.authorSteegen, An
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorMertens, Hans
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-22T01:45:02Z
dc.date.available2021-10-22T01:45:02Z
dc.date.issued2014-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23883
dc.source.beginpage828
dc.source.conferenceInternational Electron Device Meeting - IEDM
dc.source.conferencedate15/12/2014
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage831
dc.title

BTI reliability of advanced gate stacks for beyond silicon devices: challenges and opportunities

dc.typeProceedings paper
dspace.entity.typePublication
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