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Ferroelectricity in Si-doped hafnia: probing challenges in absence of screening charges

Date

2020
Journal article
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dc.contributor.authorCelano, Umberto
dc.contributor.authorGomez, Andres
dc.contributor.authorPiedimonte, Paola
dc.contributor.authorNeumayer, Sabine
dc.contributor.authorCollins, Liam
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorFlorent, Karine
dc.contributor.authorMcMitchell, Sean
dc.contributor.authorFavia, Paola
dc.contributor.authorDrijbooms, Chris
dc.contributor.authorBender, Hugo
dc.contributor.authorParedis, Kristof
dc.contributor.authorDi Piazza, Luca
dc.contributor.authorJesse, Stephen
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorvan der Heide, Paul
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorMcMitchell, Sean
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorDrijbooms, Chris
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorDi Piazza, Luca
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecVan Houdt, Jan::1234-1234-1234-1235
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.date.accessioned2021-10-28T20:38:11Z
dc.date.available2021-10-28T20:38:11Z
dc.date.issued2020
dc.identifier.issn2079-4991
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34874
dc.identifier.urlhttps://doi.org/10.3390/nano10081576
dc.source.beginpage1576
dc.source.issue8
dc.source.journalNanomaterials
dc.source.volume10
dc.title

Ferroelectricity in Si-doped hafnia: probing challenges in absence of screening charges

dc.typeJournal article
dspace.entity.typePublication
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