Publication:

Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability

Date

2023
Proceedings Paper
https://doi.org/10.1109/IRPS48203.2023.10118334
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dc.contributor.authorMartin-Martinez, Javier
dc.contributor.authorDiaz Fortuny, Javier
dc.contributor.authorSaraza Canflanca, Pablo
dc.contributor.authorRodriguez, Rosana
dc.contributor.authorCastro-Lopez, Rafael
dc.contributor.authorRoca, Elisenda
dc.contributor.authorFernandez, Francisco V.
dc.contributor.authorNafria, Montserrat
dc.contributor.imecauthorDiaz Fortuny, Javier
dc.contributor.imecauthorSaraza Canflanca, Pablo
dc.contributor.orcidimecDiaz Fortuny, Javier::0000-0002-8186-071X
dc.contributor.orcidimecSaraza Canflanca, Pablo::0000-0003-2155-8305
dc.date.accessioned2024-04-04T11:13:41Z
dc.date.available2023-07-15T17:05:48Z
dc.date.available2024-04-04T11:13:41Z
dc.date.issued2023
dc.description.wosFundingTextThis work was supported in part by MCIN/AEI/10.13039/501100011033 under Grant PID2019-103869RBC31 and Grant PID2019-103869RB-C32; and in part by the Consejeria de Economia, Conocimiento, Empresas y Universidad de la Junta de Andalucia and P. O. FEDER under Project US-1380876.
dc.identifier.doi10.1109/IRPS48203.2023.10118334
dc.identifier.eisbn978-1-6654-5672-2
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42164
dc.publisherIEEE
dc.source.conference61st IEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 26-30, 2023
dc.source.conferencelocationMonterey
dc.source.journalN/A
dc.source.numberofpages9
dc.subject.keywordsSTATISTICAL CHARACTERIZATION
dc.subject.keywordsDEVICE
dc.subject.keywordsDEGRADATION
dc.subject.keywordsBTI
dc.title

Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability

dc.typeProceedings paper
dspace.entity.typePublication
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